Lectures > Lecture 4

Lecture 4 by Jean-Yves Buffière, MATEIS INSA-Lyon, 69621 Villeurbanne Cedex, France.

Title: In situ monitoring of experiments using synchrotron X rays.

Synchrotron X ray imaging delivers images of the interior of optically opaque materials with a spatial resolution in the micrometer range and a very high temporal resolution. This enables to monitor microstructure evolution during in situ experiments. After briefly recalling the basics of the different imaging modalities, examples from different fields of research will be shown with a focus on "online" monitoring of experiments. The potential but also the limits of this type of approach will be illustrated.

Biography: Jean-Yves Buffière is Professor at INSA Lyon. His research interests include 3D characterization of the fatigue damage mechanisms of metallic alloys. In situ 3D experiments using synchrotron X ray micro-tomography are the workhorses of his activity..